DIATEM ENGINEERING

CONTEXT OF USE

DiaTem Engineering enables test engineers and designers to test and debug their electronic boards. This JTAG test station is very powerful for prototype bring-up and the test of small production series.

Prototype bring-up, debugging, programming, structural tests, functional tests, small series

OVERVIEW

DiaTem Engineering Station is the first efficient JTAG Tool dedicated to board designers and test engineers. Fully integrated in one framework, you can easily debug your electronic board, using the potential benefits brought by IEEE 1149.1 JTAG boundary scan standards. Test coverage has been increased with the clustering process of non-boundary scan components and the test of board edge connectors. Designed by test engineers, DiaTem makes test and diagnostic of faults extremely efficient. Easy to set-up, in few hours, you will get a first result of the structural and functional behaviour of your board.

FEATURES AND HIGHLIGHTS

-Test coverage analysis
-BSDL syntax checker
-Infrastructure diagnostics (scan chain integrity)
-Automatic Test Pattern Generator (ATPG) for interconnection, clusters and memories
-Interactive debugger
-Custom test development through TCL language
-Display of results as waveform or state table
-Fault detection on devices or boards through interactive access
-Interactive control and observation of signals at the register, bus or pin level
-In-System Programming Solution for Flash Memory and Programmable Logic Devices (PLD)
-Multi-TAP and GPIO access and support through TemTag USB controller

TECHNOLOGY

JTAG – JTAG Emulation – Embedded Micro-testers

BENEFITS
  • Early testability feedback during schematic stage
  • Quick tests development
  • Fast device programming developments
  • No proprietary boundary-scan programming language
  • Ability to develop @speed tests
  • Ability to control how your design will be tested during production

Supported by intuitive, generic software interface with built-in sequencer

USERS

Engineering designers, Test engineers,

ASK FOR INFORMATION

You can fill out the form (mettre le lien) with a description of your needs or you can send an email to sales@temento.com. A reply will be sent within 24 hours.

DIATEM INDUSTRIALIZATION

CONTEXT OF USE

Test and debugging of electronic boards in an industrial context. Tests program developments, debugging, programming, structural tests, functional tests.

Development of test programs in an industrialization and a production environment.

OVERVIEW

Industrialization Station allows manufacturing engineers to define test sequences to be applied in a production mode. This station enables the production and preparation of the test and programming operations to be performed on the board. Compatible with most common CAD formats to import test data, it is flexible enough to ensure compatibility with engineering teams tools and Production Stations. A Test Plan Manager authorizes to define sequences and their properties with a graph representation. The Test Plan Manager supports enhanced process controls like messages, labels or conditional branching that extent your test definition possibilities. Test Plans can then be easily and quickly exported to another Production Station as a single directory.

FEATURES AND HIGHLIGHTS

-Test coverage analysis
-BSDL syntax checker
-Infrastructure diagnostics (scan chain integrity)
-Automatic Test Pattern Generator (ATPG) for interconnection, clusters and memories
-Interactive debugger
-Custom tests development using TCL language
-Functional test of components
-Programs embedded flash in Micros and DSPs
-Display of results as waveform or state table
-Fault detection on devices or boards through interactive access
-Interactive control and observation of signals at the register, bus or pin level
-In-System Programming Solution for Flash Memory and Programmable Logic Devices (PLD)
-Test plans manager
-Ability to generate tests project
-Fault tickets edition
-Multi-TAP and GPIO access and support through TemTag USB controller

TECHNOLOGY

JTAG – JTAG Emulation – Embedded Micro-testers

BENEFITS
  • Early testability feedback during schematic stage
  • Quick tests development
  • Fast device programming developments
  • No proprietary boundary-scan programming language
  • Ability to develop @speed tests
  • Ability to control how your design will be tested during production
  • Supported by intuitive, generic software interface with built-in sequencer
USERS

Industrialization engineers, Test engineers,

ASK FOR INFORMATION

You can fill out the form (mettre le lien) with a description of your needs or you can send an email to sales@temento.com. A reply will be sent within 24 hours.

DIATEM PRODUCTION

CONTEXT OF USE

Test of electronic boards in a production environment.
Production tests, small, medium and large volumes

OVERVIEW

DiaTem Production is a JTAG test station designed for test operators who need to automatically execute test plans and test sequences on a production line. It allows selecting and running a test plan previously created on an Industrialization Station. The settings of a test sequence and the selection of a test plan are performed with the Supervisor level module in order to set up the best test strategy. The Operator level module allows working in a standardized environment, running the selected test plans and to automate your production in a Go/No Go mode. The Production Station is benefiting of definition enhancements that help archiving and tracking fabrication orders.

FEATURES AND HIGHLIGHTS

Includes all necessary features to enable a Test Plan execution provided by any Industrialization Station.

  • Test of integrity of the scan chain
  • Verification of components ID codes
  • Test of all interconnect types (ATPG 1, 2 & 3)
  • Functional Test sequences execution
  • FPGA/CPLD bits stream loader

-Fault Ticket Edition

-Bar Code Reader

-Fault report generator and export

- Capability to run parallel production tests for high volume (Templayer mode) 

- Operator Control Panel

- Supervisor Control Panel

TECHNOLOGY

JTAG – JTAG Emulation – Embedded Micro-testers

BENEFITS
  • Run the previously generated test plans
  • Apply automated test programs to the UUT
  • Execute automatic test and ISP programs
  • Monitor Operator or Supervisor priority levels
  • Deliver operations reports and fault tickets
USERS

Production operators, supervisors, test engineers,

ASK FOR INFORMATION

You can fill out the form (mettre le lien) with a description of your needs or you can send an email to sales@temento.com. A reply will be sent within 24 hours.

Tests throughout the product life cycle

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All in One

Either to debug your first electronic prototype or to run production tests on several thousand of boards, Diatem Studio offers a wide range of configurations adapted to your need.

Ease of use

Based on IEEE 1149.x JTAG boundary scan technology, DiaTem Studio delivers powerful debugging environment, high test coverage,

Scalable

Ability to move from one configuration to another and to add key features.

AT SPEED FUNCTIONAL TEST OF COMPONENTS


Driving embedded instrumentation DiaTem supports ARM, Freescale, TI and others CPUs, Altera and Xilinx FPGAs.


STANDARDS
CORNER


All information you need regarding IEEE 1149.X standards