DIASERVER

CONTEXT OF USE

Using the power of the Boundary Scan in Automatic Test Equipment’s (ATE), Teradyne Agilent, SEICA etc…

OVERVIEW

DiaServer is a JTAG test station that can be integrated in any Automatic Test Equipment (ATE), like In-Circuit Tester, (ICT), Functional tester or Bed of Nails. The DiaServer software can be monitored via a custom programs/scripts written in any language (TCL, C, C++, LabView, VIVA etc.). All testing features are available via COM/DCOM technology. The utilization of this technology is straight forward by using TCL & C/C++ libraries provided with DiaServer and also all Visual Basic for Application (VBA) features. The execution of tests can be fully automated from a central system controlling multiple testers. The client system sends queries to DiaTem server which executes them and returns a result.

FEATURES AND HIGHLIGHTS
  • COM/DCOM application programming interface
  • TCL interface and dialog box
  • Full JTAG tests benefits
  • Accurate diagnostic of the defects
  • Easy integration and monitoring
  • On board Flash programming
TECHNOLOGY

JTAG – Embedded Micro Testers (EMT) – Processors JTAG emulation

BENEFITS

• Increase the test coverage increase
• Reduce overall test time
• Enable precise defects diagnostics
• Easy integration and monitoring

USERS

Test engineers, Production tests

ASK FOR INFORMATION

You can fill out the form with a description of your needs or you can send an email to sales@temento.com. A reply will be sent within 24 hours.

FLYSCAN

CONTEXT OF USE

Designed for integration into Flying probes test equipment’s.
Prototype debugging, production tests, repair,

OVERVIEW

The combination of JTAG and flying probe allows to increase the test coverage, to enable access to areas having no test pads and to increase the overall diagnostic capability.

FEATURES AND HIGHLIGHTS

- Double GUI and COM/DCOM application programming interface
- TCL interface and dialog box
- Full JTAG tests benefits
- Accurate diagnostic of the defects
- Easy integration and monitoring
- JTAG - On board Flash programming
- Fast Flash programming par usage of Embedded Micro – Testers (EMT)
- Download FPGA bit stream files

TECHNOLOGY

JTAG – FPGA Embedded Micro-testers (EMT)

BENEFITS
  • Full JTAG tests benefits
  • Maximize the Flying probes tests coverage
  • Enable precise defects diagnostics
  • Reduce test time
  • Easy integration and monitoring
  • On board Flash programming
USERS

Engineering designers, Test engineers, Engineering and Production environments

ASK FOR INFORMATION

You can fill out the form with a description of your needs or you can send an email to sales@temento.com. A reply will be sent within 24 hours.

FLYSCAN

ADD THE POWER OF BOUNDARY SCAN TO FLYING PROBE TESTER

Test fixtures combines with boundary scan offer a way to increase test coverage and to reduce test time by combining multiple boundary-scan chains together, adding voltages management and interface to external connectons.

Temento Systems is able to handle your project since the test coverage analysis phase to the delivery of the test equipment on your production site. A project follow-up is set up with your development team that brings you visibility on the work progress.

GET MORE INFORMATION ON FLYSCAN AND ATE INTEGRATION

INCREASE TEST COVERAGE
GET MORE PINS ACCESS
IMPROVE VISIBILITÉ ON INFERNAL MODES

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